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Seventh International Conference on Thin Film Physics and Applications (24-27 September 2010, Shanghai, China)Chu, Junhao; Wang, Zhanshan.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 1 vol, isbn 978-0-8194-8568-7Conference Proceedings

Carrier and phonon dynamics in GaInNAsFAJUN MA.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 799507.1-799507.4Conference Paper

Silicon Quantum Dots: Photoluminescence Controlling and Solar Cell ApplicationWEN ZHONG SHEN.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 79952V.1-79952V.6Conference Paper

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Sixth International Conference on Thin Film Physics and Applications (25-28 September 2007, Shanghai, China)Shen, Wenzhong; Chu, Junhao.Proceedings of SPIE, the International Society for Optical Engineering. 2008, issn 0277-786X, isbn 978-0-8194-7182-6, 1Vol, various pagings, isbn 978-0-8194-7182-6Conference Proceedings

Some techniques to characterize multilayers and their interfacesJONNARD, P.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 79951T.1-79951T.6Conference Paper

Thin film physics and applications (Shanghai, 31 May - 2 June 2004)Chu, Junhao; Lai, Zongsheng; Wang, Lianwei et al.SPIE proceedings series. 2004, isbn 0-8194-5755-8, XXIII, 654 p, isbn 0-8194-5755-8Conference Proceedings

Ferroelectric Properties of BiFe0₃ Thin Films Prepared via a Simple Chemical Solution DepositionGAO CHENG; MENG XIANGJIAN; SUN JINGLAN et al.Ferroelectrics (Print). 2010, Vol 406, pp 137-142, issn 0015-0193, 6 p.Conference Paper

Discussion about the valence of Pr based on infrared spectra of PrBa₂Cu₃O₇YE HONGJUAN; FU ROULI; JIANG WEI et al.Diwen wuli xuebao. 1995, Vol 17, Num 3, pp 185-190, issn 1000-3258Article

Development of Radiation Imaging Devices with Energy Discrimination Capability Using Thick CdTe Layers Grown on Si Substrates by Metalorganic Vapor Phase EpitaxyYASUDA, K; NIRAULA, M; AGATA, Y et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 79952T.1-79952T.6Conference Paper

Electronic and optical properties of Bi_3.25La_0.75Ti₃O₁₂ and SrBi_2-xNd_xNb₂O₉ perovskite-type ferroelectric materialsHU, Z. G; CHU, J. H.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 799504.1-799504.7Conference Paper

The effects of buffer layers on the growth of smooth relaxed SiGe thin filmsSHUQI ZHENG.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 69841Y.1-69841Y.4, issn 0277-786X, isbn 978-0-8194-7182-6, 1VolConference Paper

Effect of deposition rate on the DUV/VUV reflectance of MgF₂ protected aluminum mirrors with e-beam evaporationWANG, Tong-Tong; GAO, Jin-Song.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 79952B.1-79952B.4Conference Paper

Surface modification of SiC mirror by IARE methodZHENFENG SHEN; JINSONG GAO.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 79952L.1-79952L.4Conference Paper

Designing and Preparation of Tricolor Light FilterDANGJUAN LI; SHENJIANG WU; JINJUN LU et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 799530.1-799530.4Conference Paper

Quantification of substrate cleanliness level based on thin film adhesion measurementTSUKAMOTO, Y.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 698427.1-698427.4, issn 0277-786X, isbn 978-0-8194-7182-6, 1VolConference Paper

Stress effect on electronic characteristics in heterojunction of (n⁺)nanocrystalline/(p⁺)crystalline SiWENSHENG WEI.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 698403.1-698403.4, issn 0277-786X, isbn 978-0-8194-7182-6, 1VolConference Paper

Ultraviolet-to-Infrared Dual-Band Detectors Based on Quantum Dot and Heterojunction StructuresUNIL PERERA, A. G.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 698432.1-698432.6, issn 0277-786X, isbn 978-0-8194-7182-6, 1VolConference Paper

Design and Monitoring Approaches for the Production of High Quality Optical CoatingsTIKHONRAVOV, Alexander V; TRUBETSKOV, Michael K.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 79951Q.1-79951Q.6Conference Paper

Effects of annealing on the structural properties of Cu(In,Ga)Se₂ thin films prepared by RF sputteringGANG SHI; JUNHAO CHU.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 79950A.1-79950A.4Conference Paper

Surface plasmon polaritons of multi-layered structures containing metamaterialLI WANG; GUIQIANG DU; BINGYUAN ZHANG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 79950L.1-79950L.4Conference Paper

Contact resistance in organic transistors with different structuresHU JIAXING; NIU LIANBIN; GUO RONGLI et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 79950D.1-79950D.8Conference Paper

MBE growth and electrical properties of InSb film on GaAs substrateZHANG, Y. H; CHEN, P. P; Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 79952G.1-79952G.4Conference Paper

New design concept of hard X-ray supermirrors for astronomical X-ray telescopesFANGFANG WANG; JINGTAO ZHU; MOYAN TAN et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 799508.1-799508.4Conference Paper